Probe Assembly

DFW Test Incorporated has been providing high quality probe cards to the semiconductor test industry for 20 years. Specializing in cantilever, we offer an unrivaled turn time to get you back to testing. Our capabilities include:

  • Min. pitch ~40um
  • Multi-site
  • Hot and cold temp
  • Ceramic and Metal blade

 

Vertical Probe

  •  PCB design and project management services for all major vertical suppliers.

 

Test

  • API analyzer testing is performed prior to shipment.